X-Ray and Image Analysis in Electron Microscopy

by Friel, John J.
ISBN: 9780964145528
Availability:
$4.99

Available Offers


Pickup at {0} Out of stock at {0} Check other stores
FREE
Ship to Me
$3.99

Overview

  • Format: Hardcover
  • Author: Friel, John J.
  • ISBN: 9780964145528
  • Condition: Used
  • Number Of Pages: 113
  • Publication Year: 2004
Language: English