Characterization of Defects in Materials

by Siegel, Richard W.; Weertman, Julia R.; Sinclair, Robert (EDT)
ISBN: 9780931837470
Availability:
$23.99

Available Offers


Pickup at {0} Out of stock at {0} Check other stores
FREE
Ship to Me
$3.99

Overview

  • Format: Hardcover
  • Author: Siegel, Richard W.; Weertman, Julia R.; Sinclair, Robert (EDT)
  • ISBN: 9780931837470
  • Condition: Used
  • Publication Year: 1987