Advances in Optics of Charged Particle Analyzers: Volume 233

by Hawkes, Peter W.
ISBN: 9780443317200
Availability:
null

Available Offers

Pickup at {0} Out of stock at {0} Check other stores
FREE
Ship to Me
$3.99

Overview

Advances in Optics of Charged Particle Analyzers: Part 2, Volume 233 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.
  • Format: Hardcover
  • Author: Hawkes, Peter W.
  • ISBN: 9780443317200
  • Condition: New
  • Number Of Pages: 232
  • Publication Year: 2025
Language: English

Customer Reviews (0)

This title hasn’t been rated yet...be the first!